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Ensuring Accurate Material Properties for Simulation with Digital Image Correlation

January 30, 2020 @ 8:00 am - 9:00 am

Learn how DIC material testing can be used to accurately measure CTE of components and boards.

Details

Date:
January 30, 2020
Time:
8:00 am - 9:00 am
Event Category:
Website:
https://register.gotowebinar.com/register/4136655617222036237?source=ANSYS+website

Organizer

ANSYS

Venue

Online

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